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dc.contributor.authorVandersteen, Gerd
dc.contributor.authorRolain, Y.
dc.contributor.authorSchoukens, J.
dc.date.accessioned2021-10-14T18:12:03Z
dc.date.available2021-10-14T18:12:03Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5776
dc.sourceIIOimport
dc.titleAn identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions
dc.typeJournal article
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.beginpage1355
dc.source.endpage1363
dc.source.journalIEEE Trans. Instrumentation and Measurement
dc.source.issue5
dc.source.volume50
imec.availabilityPublished - imec


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