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New approach for calculation of line parameters of IC interconnects

dc.contributor.authorYmeri, Hasan
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMaex, Karen
dc.contributor.authorDe Roest, David
dc.date.accessioned2021-10-14T18:29:08Z
dc.date.available2021-10-14T18:29:08Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5860
dc.sourceIIOimport
dc.titleNew approach for calculation of line parameters of IC interconnects
dc.typeJournal article
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorDe Roest, David
dc.source.peerreviewno
dc.source.beginpage29
dc.source.endpage31
dc.source.journalMicroelectronics International
dc.source.issue1
dc.source.volume18
imec.availabilityPublished - imec


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