Show simple item record

Relation between hole traps and non-reactive hydrogen induced positive charges

dc.contributor.authorZhang, J.
dc.contributor.authorZhao, C.D.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorEllis, J. N.
dc.contributor.authorBeech, C. D.
dc.date.accessioned2021-10-14T18:31:15Z
dc.date.available2021-10-14T18:31:15Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5870
dc.sourceIIOimport
dc.titleRelation between hole traps and non-reactive hydrogen induced positive charges
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.source.peerreviewno
dc.source.beginpage67
dc.source.endpage72
dc.source.journalMicroelectronic Engineering
dc.source.issue1_4
dc.source.volume59
imec.availabilityPublished - imec
imec.internalnotes12th INFOS Conference - Insulating Films on Semiconductors; June 2001; Udine, Italy


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record