dc.contributor.author | Afanas'ev, V. V. | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Stesmans, Andre | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-14T21:06:56Z | |
dc.date.available | 2021-10-14T21:06:56Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5936 | |
dc.source | IIOimport | |
dc.title | Band alignments in metal-oxide-silicon structures with atomic-layer deposited Al2O3 and ZrO2 | |
dc.type | Journal article | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Stesmans, Andre | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.source.peerreview | no | |
dc.source.beginpage | 3079 | |
dc.source.endpage | 3084 | |
dc.source.journal | Journal of Applied Physics | |
dc.source.issue | 5 | |
dc.source.volume | 91 | |
imec.availability | Published - imec | |