Show simple item record

High-resolution SILC measurements of thin SiO2 at ultra low voltages

dc.contributor.authorAresu, S.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorDreesen, R.
dc.contributor.authorKroes, K.
dc.contributor.authorAndries, E.
dc.contributor.authorManca, Jean
dc.contributor.authorDe Schepper, Luc
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorD'Olieslaeger, Marc
dc.contributor.authorD'Haen, Jan
dc.date.accessioned2021-10-14T21:07:16Z
dc.date.available2021-10-14T21:07:16Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5958
dc.sourceIIOimport
dc.titleHigh-resolution SILC measurements of thin SiO2 at ultra low voltages
dc.typeJournal article
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorD'Olieslaeger, Marc
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1485
dc.source.endpage1489
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume42
imec.availabilityPublished - open access
imec.internalnotes13th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF; October 2002; Rimini, Italy


Files in this item

Thumbnail
Name:
6492.pdf
Size:
547.1Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record