Browsing Presentations by imec author "15671b5db14c9ad88c8d04818e9d910569458399"
Now showing items 1-9 of 9
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Advancing c-Si PV research from module manufacturing through to system simulation: The buildup of Imec capabilities in EnergyVille
Govaerts, Jonathan; Goverde, Hans; Borgers, Tom; van der Heide, Arvid; Horvath, Imre T; Manganiello, Patrizio; Tsanakas, Ioannis; Van Dyck, Rik; Chowdhury, Gofran; El Chami, Ibrahim; Bakovasilis, Apostolos; Voroshazi, Eszter; Nivelle, Philippe; Carolus, Jorne; Daenen, Michaël; Vastmans, Luc; Moors, Reinoud; Doumen, Geert; Flamand, Giovanni; Pieters, Philip; Szlufcik, Jozef; Poortmans, Jef (2019) -
Expansion of the mechanical sub cell model with interface parameters provided by mechanical testing
Nivelle, Philippe; Borgers, T.; Govaerts, J.; van der Heide, Arvid; Daenen, Michaël; Singh, S.; Pedreira, O.; Desta, Derese; Horvath, T.I.; Voroshazi, Eszter; Poortmans, Jef (2017) -
Impact of potential-induced degradation (PID) on PV parameters
Carolus, Jorne; Govaerts, Jonathan; Voroshazi, Eszter; De Ceuninck, Ward; Daenen, Michaël (2017) -
Impact of potential-induced degradation(PID) on PV parameters
Carolus, Jorne; Govaerts, Jonathan; Voroshazi, Eszter; De Ceuninck, Ward; Daenen, Michaël (2017) -
Investigating the degradation kinetics of c-Si and CIGS solar cells under potentiam induced degradation by various material characterization techniques
Purohit, Zeel; Carolus, Jorne; Chaliyawala, Harsh; Kumar, Manoj; Jain, Shubhandra; Gundimeda, Abhiram; Agrawal, Neha; Gupta, Govind; Daenen, Michaël; Tripathi, Brijesh (2019) -
Mechanical sensitivity analysis of a sub cell using wire interconnection
Nivelle, Philippe; Daenen, Michaël; Borgers, T.; Govaerts, J.; Voroshazi, E.; Poortmans, Jef (2017) -
Potential-induced degradation (PID): A test campaign at module level
Carolus, Jorne; Daenen, Michaël (2016) -
Potential-induced degradation (PID); A test campaign at module level
Carolus, Jorne; Daenen, Michaël (2016) -
Proposing amodel to investigate the impact of interconnectiontechnology on shading damage by TFPV modules
Carolus, Jorne; Van De Sande, Wieland; Vandebergh, Thomas; Bakker, Klaas; Meuris, Marc; Daenen, Michaël (2017)