Browsing Presentations by imec author "d3c1e749183108cecdff8d731230b2d41d8ef6cd"
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Atom probe tomography on contemporary semiconductor devices: Challenges in data acquisition, quantification and spatial accuracy
Scheerder, Jeroen; Fleischmann, Claudia; Dialameh, Masoud; Melkonyan, Davit; Morris, Richard; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Electronic detection of spin transport in metallic and graphene based non-local spin valves
Scheerder, Jeroen; Raes, Bart; Fritzsche, Joachim; Verellen, Niels; Valenzuela, S.O.; Moshchalkov, Victor; Janssens, Ewald; Van de Vondel, Joris (2015) -
Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
Cuduvally, Ramya; Oosterbos, Giel; Morris, Richard; Fleischmann, Claudia; Ferrari, Piero; Scheerder, Jeroen; Vantomme, Andre; Vandervorst, Wilfried (2019)