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Characterization of a point-contact on silicon using force microscopy-supported resistance measurements

dc.contributor.authorDe Wolf, Peter
dc.contributor.authorSnauwaerts, Jan
dc.contributor.authorClarysse, Trudo
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHellemans, L.
dc.date.accessioned2021-09-29T13:05:17Z
dc.date.available2021-09-29T13:05:17Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/602
dc.sourceIIOimport
dc.titleCharacterization of a point-contact on silicon using force microscopy-supported resistance measurements
dc.typeJournal article
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.beginpage1530
dc.source.endpage2
dc.source.journalAppl. Phys. Lett.
dc.source.issue12
dc.source.volume66
imec.availabilityPublished - imec


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