Fast and accurate extraction of parasitic resistances for nonlinear GaAs MESFET device models
dc.contributor.author | Debie, Peter | |
dc.contributor.author | Martens, Luc | |
dc.date.accessioned | 2021-09-29T13:05:23Z | |
dc.date.available | 2021-09-29T13:05:23Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/607 | |
dc.source | IIOimport | |
dc.title | Fast and accurate extraction of parasitic resistances for nonlinear GaAs MESFET device models | |
dc.type | Journal article | |
dc.contributor.imecauthor | Martens, Luc | |
dc.source.peerreview | no | |
dc.source.beginpage | 2239 | |
dc.source.endpage | 2242 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 12 | |
dc.source.volume | 42 | |
imec.availability | Published - imec |
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