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Improved error correction technique for on-wafer lightwave measurements of photodetectors

dc.contributor.authorDebie, Peter
dc.contributor.authorMartens, Luc
dc.contributor.authorKaiser, D.
dc.date.accessioned2021-09-29T13:05:24Z
dc.date.available2021-09-29T13:05:24Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/608
dc.sourceIIOimport
dc.titleImproved error correction technique for on-wafer lightwave measurements of photodetectors
dc.typeJournal article
dc.contributor.imecauthorMartens, Luc
dc.source.peerreviewno
dc.source.beginpage418
dc.source.endpage420
dc.source.journalIEEE Photonics Technology Letters
dc.source.issue4
dc.source.volume7
imec.availabilityPublished - imec


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