Show simple item record

Radiation damage in flash memory cells

dc.contributor.authorClaeys, Cor
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorNakabayashi, M.
dc.contributor.authorKobayashi, K.
dc.date.accessioned2021-10-14T21:14:55Z
dc.date.available2021-10-14T21:14:55Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6116
dc.sourceIIOimport
dc.titleRadiation damage in flash memory cells
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage392
dc.source.endpage400
dc.source.journalNuclear Instruments & Methods in Physics Research B
dc.source.issue1_4
dc.source.volume186
imec.availabilityPublished - imec
imec.internalnotesSymp. B on Defect Engineering of Advanced Semiconductor Devices, E-MRS Spring Conference. June 2001; Strasbourg, France


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record