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Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate

dc.contributor.authorDe Roest, David
dc.contributor.authorYmeri, Hasan
dc.contributor.authorVandenberghe, S.
dc.contributor.authorStucchi, Michele
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorMaex, Karen
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-10-14T21:23:53Z
dc.date.available2021-10-14T21:23:53Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6212
dc.sourceIIOimport
dc.titleSome measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate
dc.typeJournal article
dc.contributor.imecauthorDe Roest, David
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorNauwelaers, Bart
dc.source.peerreviewno
dc.source.beginpage103
dc.source.endpage104
dc.source.journalIEEE Electron Device Letters
dc.source.issue2
dc.source.volume23
imec.availabilityPublished - imec


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