Studie van de Elektrische Eigenschappen van Si/SiO2 Strukturen met een Ultradunne Oxydelaag
| dc.contributor.author | Depas, Michel | |
| dc.date.accessioned | 2021-09-29T13:05:47Z | |
| dc.date.available | 2021-09-29T13:05:47Z | |
| dc.date.issued | 1995-03 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/625 | |
| dc.source | IIOimport | |
| dc.title | Studie van de Elektrische Eigenschappen van Si/SiO2 Strukturen met een Ultradunne Oxydelaag | |
| dc.type | PHD thesis | |
| dc.source.peerreview | no | |
| imec.availability | Published - imec | |
| imec.internalnotes | Thesis Advisor: Prof. Dr. F. Cardon |
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