dc.contributor.author | Ernur, Didem | |
dc.contributor.author | Kondo, S. | |
dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-14T21:35:51Z | |
dc.date.available | 2021-10-14T21:35:51Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6311 | |
dc.source | IIOimport | |
dc.title | Investigation of barrier and slurry effects on the galvanic corrosion of copper | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ernur, Didem | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.beginpage | 117 | |
dc.source.endpage | 124 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 1_4 | |
dc.source.volume | 64 | |
imec.availability | Published - imec | |
imec.internalnotes | MAM2002; Vaals, The Netherlands, 3-6 March 2002 | |