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Simultaneous atomic force microscope and quartz crystal microbalance measurements: interactions and displacement field of a quartz crystal microbalance

dc.contributor.authorFriedt, Jean-Michel
dc.contributor.authorChoi, Kang-Hoon
dc.contributor.authorFrancis, Laurent
dc.contributor.authorCampitelli, Andrew
dc.date.accessioned2021-10-14T21:39:09Z
dc.date.available2021-10-14T21:39:09Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6335
dc.sourceIIOimport
dc.titleSimultaneous atomic force microscope and quartz crystal microbalance measurements: interactions and displacement field of a quartz crystal microbalance
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage3974
dc.source.endpage3977
dc.source.journalJapanese Journal of Applied Physics. Part 1
dc.source.issue6A
dc.source.volume41
imec.availabilityPublished - imec


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