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A model-based technique for the measurement of skin thickness in mammography

dc.contributor.authorKatartzis, Antonios
dc.contributor.authorSahli, Hichem
dc.contributor.authorCornelis, Jan
dc.contributor.authorFotopoulos, Spyros
dc.contributor.authorPanayiotakis, Giorgos
dc.date.accessioned2021-10-14T21:59:49Z
dc.date.available2021-10-14T21:59:49Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6466
dc.sourceIIOimport
dc.titleA model-based technique for the measurement of skin thickness in mammography
dc.typeJournal article
dc.contributor.imecauthorSahli, Hichem
dc.contributor.imecauthorCornelis, Jan
dc.source.peerreviewno
dc.source.beginpage153
dc.source.endpage162
dc.source.journalMedical and Biological Engineering and Computing
dc.source.issue2
dc.source.volume40
imec.availabilityPublished - imec


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