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Low Weibull slope of breakdown distributions in high-K layers

dc.contributor.authorKauerauf, Thomas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorCartier, Eduard
dc.contributor.authorSoens, Charlotte
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-14T22:00:14Z
dc.date.available2021-10-14T22:00:14Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6468
dc.sourceIIOimport
dc.titleLow Weibull slope of breakdown distributions in high-K layers
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage215
dc.source.endpage217
dc.source.journalIEEE Electron Device Letters
dc.source.issue4
dc.source.volume23
imec.availabilityPublished - imec


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