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Growth and characterization of Al1-xMnxAs(X<=4%) magnetic semiconductor: thin films and superlattices

dc.contributor.authorLiu, Zhiyu
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorMoshchalkov, V.V.
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-14T22:14:02Z
dc.date.available2021-10-14T22:14:02Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6548
dc.sourceIIOimport
dc.titleGrowth and characterization of Al1-xMnxAs(X<=4%) magnetic semiconductor: thin films and superlattices
dc.typeJournal article
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorBorghs, Gustaaf
dc.source.peerreviewno
dc.source.beginpage967
dc.source.endpage969
dc.source.journalJournal of Magnetism and Magnetic Materials
dc.source.volume242
imec.availabilityPublished - imec


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