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Exploring the interconnect red brick wall

dc.contributor.authorMaex, Karen
dc.contributor.authorBeyne, Eric
dc.contributor.authorCatthoor, Francky
dc.contributor.authorCorporaal, Henk
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-10-14T22:17:26Z
dc.date.available2021-10-14T22:17:26Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6567
dc.sourceIIOimport
dc.titleExploring the interconnect red brick wall
dc.typeJournal article
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage13
dc.source.endpage16
dc.source.journalEuropean Semiconductor
dc.source.issueDec.
dc.source.volume24
imec.availabilityPublished - open access


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