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Multiple parallel conduction paths observed in depth-profiled N-GaN epilayers

dc.contributor.authorMavroidis, C.
dc.contributor.authorHarris, J. J.
dc.contributor.authorJackman, R. B.
dc.contributor.authorHarrison, I.
dc.contributor.authorAnsell, B. J.
dc.contributor.authorBougrioua, Zahia
dc.contributor.authorMoerman, Ingrid
dc.date.accessioned2021-10-14T22:22:09Z
dc.date.available2021-10-14T22:22:09Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6592
dc.sourceIIOimport
dc.titleMultiple parallel conduction paths observed in depth-profiled N-GaN epilayers
dc.typeJournal article
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.source.peerreviewno
dc.source.beginpage9835
dc.source.endpage9840
dc.source.journalJournal of Applied Physics
dc.source.issue12
dc.source.volume91
imec.availabilityPublished - imec


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