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dc.contributor.authorMonroy, E.
dc.contributor.authorCalle, F.
dc.contributor.authorRanchal, R.
dc.contributor.authorVerdu, M.
dc.contributor.authorSanchez, F.J.
dc.contributor.authorMontojo, M.T.
dc.contributor.authorEickhoff, M.
dc.contributor.authorOmnès, F.
dc.contributor.authorBougrioua, Z.
dc.contributor.authorMoerman, Ingrid
dc.date.accessioned2021-10-14T22:27:39Z
dc.date.available2021-10-14T22:27:39Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6621
dc.sourceIIOimport
dc.titleThermal stability of Pt- and Ni-based Schottky contacts on GaN and Al0.31Ga0.69N
dc.typeJournal article
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.source.peerreviewno
dc.source.beginpageL47
dc.source.endpageL54
dc.source.journalSemiconductor Science and Technology
dc.source.issue9
dc.source.volume17
imec.availabilityPublished - imec


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