Thermal stability of Pt- and Ni-based Schottky contacts on GaN and Al0.31Ga0.69N
dc.contributor.author | Monroy, E. | |
dc.contributor.author | Calle, F. | |
dc.contributor.author | Ranchal, R. | |
dc.contributor.author | Verdu, M. | |
dc.contributor.author | Sanchez, F.J. | |
dc.contributor.author | Montojo, M.T. | |
dc.contributor.author | Eickhoff, M. | |
dc.contributor.author | Omnès, F. | |
dc.contributor.author | Bougrioua, Z. | |
dc.contributor.author | Moerman, Ingrid | |
dc.date.accessioned | 2021-10-14T22:27:39Z | |
dc.date.available | 2021-10-14T22:27:39Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6621 | |
dc.source | IIOimport | |
dc.title | Thermal stability of Pt- and Ni-based Schottky contacts on GaN and Al0.31Ga0.69N | |
dc.type | Journal article | |
dc.contributor.imecauthor | Moerman, Ingrid | |
dc.contributor.orcidimec | Moerman, Ingrid::0000-0003-2377-3674 | |
dc.source.peerreview | no | |
dc.source.beginpage | L47 | |
dc.source.endpage | L54 | |
dc.source.journal | Semiconductor Science and Technology | |
dc.source.issue | 9 | |
dc.source.volume | 17 | |
imec.availability | Published - imec |
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