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Effects of mechanical stress on polycrystalline-silicon resistors

dc.contributor.authorNakabayashi, M.
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorIkegami, M.
dc.contributor.authorClaeys, Cor
dc.contributor.authorKobayashi, K.
dc.contributor.authorYoneoka, M.
dc.contributor.authorMiyahara, K.
dc.date.accessioned2021-10-14T22:30:41Z
dc.date.available2021-10-14T22:30:41Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6636
dc.sourceIIOimport
dc.titleEffects of mechanical stress on polycrystalline-silicon resistors
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage195
dc.source.endpage199
dc.source.journalThin Solid Films
dc.source.issue1_2
dc.source.volume406
imec.availabilityPublished - imec


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