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Irradiation temperature dependence of radiation damage in Si photodiodes

dc.contributor.authorOhyama, H.
dc.contributor.authorHayama, K.
dc.contributor.authorTakakura, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorUemura, J.
dc.contributor.authorKishikawa, T.
dc.date.accessioned2021-10-14T22:34:51Z
dc.date.available2021-10-14T22:34:51Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6657
dc.sourceIIOimport
dc.titleIrradiation temperature dependence of radiation damage in Si photodiodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1368
dc.source.endpage1371
dc.source.conferenceProceedings International Conference on Electrical Engineering
dc.source.conferencedate7/07/2002
dc.source.conferencelocationJeju Korea
imec.availabilityPublished - imec


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