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Characterization of a single-layer quantum wire structure grown directly on a submicron grating

dc.contributor.authorGustaffson, A.
dc.contributor.authorSamuelson, L.
dc.contributor.authorHessman, D.
dc.contributor.authorMalm, J. O.
dc.contributor.authorVermeire, Gerrit
dc.contributor.authorDemeester, Piet
dc.date.accessioned2021-09-29T13:06:59Z
dc.date.available2021-09-29T13:06:59Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/666
dc.sourceIIOimport
dc.titleCharacterization of a single-layer quantum wire structure grown directly on a submicron grating
dc.typeJournal article
dc.contributor.imecauthorDemeester, Piet
dc.source.peerreviewno
dc.source.beginpage308
dc.source.endpage17
dc.source.journalJ. Vac. Sci. Technol. B
dc.source.issue2
dc.source.volume13
imec.availabilityPublished - imec


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