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dc.contributor.authorPinel, S.
dc.contributor.authorMarty, A.
dc.contributor.authorTasselli, J.
dc.contributor.authorBailbe, J. P.
dc.contributor.authorBeyne, Eric
dc.contributor.authorVan Hoof, Rita
dc.contributor.authorMarco, S.
dc.contributor.authorMorante, J. R.
dc.contributor.authorVendier, O.
dc.contributor.authorHuan, M.
dc.date.accessioned2021-10-14T22:48:44Z
dc.date.available2021-10-14T22:48:44Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6725
dc.sourceIIOimport
dc.titleThermal modeling and management in ultrathin chip stack technology
dc.typeJournal article
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorVan Hoof, Rita
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewno
dc.source.beginpage244
dc.source.endpage253
dc.source.journalIEEE Trans. Components and Packaging Technologies
dc.source.issue2
dc.source.volume25
imec.availabilityPublished - imec


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