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The low-frequency noise performance of scaled deep submicron metal-oxide-semiconductor devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T23:10:30Z
dc.date.available2021-10-14T23:10:30Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6828
dc.sourceIIOimport
dc.titleThe low-frequency noise performance of scaled deep submicron metal-oxide-semiconductor devices
dc.typeBook chapter
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.bookNoise and Fluctuations Control in Electronic Devices
imec.availabilityPublished - imec
imec.internalnotesChapter 8


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