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Recombination activity of iron-related complexes in silicon studied by temperature dependent carrier lifetime measurements

dc.contributor.authorKaniava, Arvydas
dc.contributor.authorRotondaro, Antonio
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorMenczigar, U.
dc.contributor.authorGaubas, Eugenijus
dc.date.accessioned2021-09-29T13:08:14Z
dc.date.available2021-09-29T13:08:14Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/700
dc.sourceIIOimport
dc.titleRecombination activity of iron-related complexes in silicon studied by temperature dependent carrier lifetime measurements
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage3930
dc.source.endpage3932
dc.source.journalApplied Physics Letters
dc.source.issue26
dc.source.volume67
imec.availabilityPublished - imec


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