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On the frequency-dependent line admittance of VLSI interconnect lines on silicon-based semiconductor substrates

dc.contributor.authorYmeri, Hasan
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-15T00:08:24Z
dc.date.available2021-10-15T00:08:24Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7081
dc.sourceIIOimport
dc.titleOn the frequency-dependent line admittance of VLSI interconnect lines on silicon-based semiconductor substrates
dc.typeJournal article
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewno
dc.source.beginpage449
dc.source.endpage458
dc.source.journalMicroelectronics Journal
dc.source.issue5_6
dc.source.volume33
imec.availabilityPublished - imec


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