On the frequency-dependent line admittance of VLSI interconnect lines on silicon-based semiconductor substrates
dc.contributor.author | Ymeri, Hasan | |
dc.contributor.author | Nauwelaers, Bart | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-15T00:08:24Z | |
dc.date.available | 2021-10-15T00:08:24Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7081 | |
dc.source | IIOimport | |
dc.title | On the frequency-dependent line admittance of VLSI interconnect lines on silicon-based semiconductor substrates | |
dc.type | Journal article | |
dc.contributor.imecauthor | Nauwelaers, Bart | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.beginpage | 449 | |
dc.source.endpage | 458 | |
dc.source.journal | Microelectronics Journal | |
dc.source.issue | 5_6 | |
dc.source.volume | 33 | |
imec.availability | Published - imec |
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