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Highly accurate closed form approximation for frequency-dependent line impedance of a lossy silicon substrate IC interconnect

dc.contributor.authorYmeri, Hasan
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMaex, Karen
dc.contributor.authorDe Roest, David
dc.contributor.authorStucchi, Michele
dc.date.accessioned2021-10-15T00:08:53Z
dc.date.available2021-10-15T00:08:53Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7083
dc.sourceIIOimport
dc.titleHighly accurate closed form approximation for frequency-dependent line impedance of a lossy silicon substrate IC interconnect
dc.typeJournal article
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorDe Roest, David
dc.contributor.imecauthorStucchi, Michele
dc.source.peerreviewno
dc.source.beginpage31
dc.source.endpage37
dc.source.journalMicroelectronic Engineering
dc.source.issue1_2
dc.source.volume60
imec.availabilityPublished - imec


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