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dc.contributor.authorZhang, J.F.
dc.contributor.authorZhao, C.Z.
dc.contributor.authorSii, H.K.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorEllis, J.N.
dc.contributor.authorBeech, C.D.
dc.date.accessioned2021-10-15T00:11:42Z
dc.date.available2021-10-15T00:11:42Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7094
dc.sourceIIOimport
dc.titleRelation between hole traps and hydrogenous species in silicon dioxides
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1839
dc.source.endpage1847
dc.source.journalSolid-State Electronics
dc.source.issue11
dc.source.volume46
imec.availabilityPublished - open access


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