Relation between hole traps and hydrogenous species in silicon dioxides
dc.contributor.author | Zhang, J.F. | |
dc.contributor.author | Zhao, C.Z. | |
dc.contributor.author | Sii, H.K. | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Ellis, J.N. | |
dc.contributor.author | Beech, C.D. | |
dc.date.accessioned | 2021-10-15T00:11:42Z | |
dc.date.available | 2021-10-15T00:11:42Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7094 | |
dc.source | IIOimport | |
dc.title | Relation between hole traps and hydrogenous species in silicon dioxides | |
dc.type | Journal article | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1839 | |
dc.source.endpage | 1847 | |
dc.source.journal | Solid-State Electronics | |
dc.source.issue | 11 | |
dc.source.volume | 46 | |
imec.availability | Published - open access |