Determination of interface energy band diagram between (100)Si and mixed Al-Hf oxides using internal electron photoemission
dc.contributor.author | Afanas'ev, V.V. | |
dc.contributor.author | Stesmans, Andre | |
dc.contributor.author | Tsai, Wilman | |
dc.date.accessioned | 2021-10-15T03:58:36Z | |
dc.date.available | 2021-10-15T03:58:36Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7121 | |
dc.source | IIOimport | |
dc.title | Determination of interface energy band diagram between (100)Si and mixed Al-Hf oxides using internal electron photoemission | |
dc.type | Journal article | |
dc.contributor.imecauthor | Stesmans, Andre | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 245 | |
dc.source.endpage | 247 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 2 | |
dc.source.volume | 82 | |
imec.availability | Published - open access |