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dc.contributor.authorArkhipov, Vladimir
dc.contributor.authorReynaert, Johan
dc.contributor.authorJin, Yadong
dc.contributor.authorHeremans, Paul
dc.contributor.authorEmelianova, E.V.
dc.contributor.authorAdriaenssens, G.J.
dc.contributor.authorBassler, H.
dc.date.accessioned2021-10-15T03:59:17Z
dc.date.available2021-10-15T03:59:17Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7156
dc.sourceIIOimport
dc.titleThe effect of deep traps on carrier hopping in disordered organic materials
dc.typeJournal article
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.beginpage209
dc.source.endpage212
dc.source.journalSynthetic Metals
dc.source.issue1_2
dc.source.volume138
imec.availabilityPublished - imec


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