dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-15T04:01:14Z | |
dc.date.available | 2021-10-15T04:01:14Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7208 | |
dc.source | IIOimport | |
dc.title | Multilayer thin-film technology, enabling technology for solving high-density interconnect and assembly problems | |
dc.type | Journal article | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 191 | |
dc.source.endpage | 199 | |
dc.source.journal | Nuclear Instruments & Methods in Physics Research A | |
dc.source.volume | 509 | |
imec.availability | Published - imec | |
imec.internalnotes | Paper from the 4th Int. Workshop on Radiation Imaging Detectors; Sept. 2002; Amsterdam | |