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Results of noise examination of fully-depleted accumulation-mode SOI pMOSFETs

dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-09-29T13:09:53Z
dc.date.available2021-09-29T13:09:53Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/737
dc.sourceIIOimport
dc.titleResults of noise examination of fully-depleted accumulation-mode SOI pMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage36
dc.source.endpage37
dc.source.conference1995 IEEE International SOI Conference Proceedings; 2-5 Oct. 1995; Tucson, AZ, USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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