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Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions

dc.contributor.authorDas, Johan
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorStein, S.
dc.contributor.authorKohlstedt, H.
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorDe Boeck, Jo
dc.date.accessioned2021-10-15T04:15:39Z
dc.date.available2021-10-15T04:15:39Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7382
dc.sourceIIOimport
dc.titleStatistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorDe Boeck, Jo
dc.source.peerreviewno
dc.source.beginpage2749
dc.source.endpage2751
dc.source.journalJ. Applied Physics
dc.source.issue4
dc.source.volume94
imec.availabilityPublished - imec


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