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Degradation and breakdown of plasma oxidized magnetic tunnel junctions: single trap creation in Al2O3 tunnel barriers

dc.contributor.authorDas, Johan
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorBoeve, Hans
dc.contributor.authorVanhelmont, Frederik
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorDe Boeck, Jo
dc.date.accessioned2021-10-15T04:15:46Z
dc.date.available2021-10-15T04:15:46Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7383
dc.sourceIIOimport
dc.titleDegradation and breakdown of plasma oxidized magnetic tunnel junctions: single trap creation in Al2O3 tunnel barriers
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.beginpage2815
dc.source.endpage2817
dc.source.journalIEEE Trans. Magnetics
dc.source.issue5
dc.source.volume39
imec.availabilityPublished - imec


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