dc.contributor.author | Das, Johan | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Boeve, Hans | |
dc.contributor.author | Vanhelmont, Frederik | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Borghs, Gustaaf | |
dc.contributor.author | De Boeck, Jo | |
dc.date.accessioned | 2021-10-15T04:15:46Z | |
dc.date.available | 2021-10-15T04:15:46Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7383 | |
dc.source | IIOimport | |
dc.title | Degradation and breakdown of plasma oxidized magnetic tunnel junctions: single trap creation in Al2O3 tunnel barriers | |
dc.type | Journal article | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Borghs, Gustaaf | |
dc.contributor.imecauthor | De Boeck, Jo | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.source.peerreview | no | |
dc.source.beginpage | 2815 | |
dc.source.endpage | 2817 | |
dc.source.journal | IEEE Trans. Magnetics | |
dc.source.issue | 5 | |
dc.source.volume | 39 | |
imec.availability | Published - imec | |