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A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K

dc.contributor.authorMartino, Joao Antonio
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T13:10:47Z
dc.date.available2021-09-29T13:10:47Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/756
dc.sourceIIOimport
dc.titleA new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1799
dc.source.endpage1803
dc.source.journalSolid-State Electronics
dc.source.issue10
dc.source.volume38
imec.availabilityPublished - open access


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