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Defect generation under electrical stress: experimental characterization and modelling

dc.contributor.authorHoussa, Michel
dc.date.accessioned2021-10-15T04:56:54Z
dc.date.available2021-10-15T04:56:54Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7664
dc.sourceIIOimport
dc.titleDefect generation under electrical stress: experimental characterization and modelling
dc.typeBook chapter
dc.contributor.imecauthorHoussa, Michel
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.source.peerreviewno
dc.source.beginpage467
dc.source.bookHigh-K Gate Dielectrics
dc.source.endpage495
imec.availabilityPublished - imec
imec.internalnotesChapter 4.6


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