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Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics

dc.contributor.authorKumar, Vikram
dc.contributor.authorJain, Suresh
dc.contributor.authorKapoor, A.K.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorMertens, Robert
dc.date.accessioned2021-10-15T05:15:18Z
dc.date.available2021-10-15T05:15:18Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7761
dc.sourceIIOimport
dc.titleTrap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics
dc.typeJournal article
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage1283
dc.source.endpage1285
dc.source.journalJournal of Applied Physics
dc.source.issue2
dc.source.volume94
imec.availabilityPublished - imec


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