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Extraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes

dc.contributor.authorPoyai, Amporn
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGaubas, E.
dc.contributor.authorHuber, A.
dc.contributor.authorGräf, D.
dc.date.accessioned2021-10-15T06:14:53Z
dc.date.available2021-10-15T06:14:53Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8037
dc.sourceIIOimport
dc.titleExtraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage189
dc.source.endpage192
dc.source.journalMaterials Science and Engineering B
dc.source.issue1_3
dc.source.volume102
imec.availabilityPublished - imec
imec.internalnotesE-MRS 2002 Symposium E: Advanced Characterisation of Semiconductors Strasbourg, 18 June - 21 June 2002


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