Show simple item record

Comparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon

dc.contributor.authorTakakura, K.
dc.contributor.authorOhyama, H.
dc.contributor.authorYoshida, T.
dc.contributor.authorMurakawa, H.
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorJob, R.
dc.contributor.authorUlyashin, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T06:55:33Z
dc.date.available2021-10-15T06:55:33Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8203
dc.sourceIIOimport
dc.titleComparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1022
dc.source.endpage1025
dc.source.journalPhysica B
dc.source.volume340-342
imec.availabilityPublished - imec
imec.internalnotes22nd International Conference on Defects in Semiconductors; July 2003; Aarhus, Denmark


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record