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MOSFET bias dependent series resistance extraction from RF measurements

dc.contributor.authorTorres-Torres, Reydezel
dc.contributor.authorMurphy-Arteaga, R.S.
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-15T07:00:11Z
dc.date.available2021-10-15T07:00:11Z
dc.date.issued2003-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8221
dc.sourceIIOimport
dc.titleMOSFET bias dependent series resistance extraction from RF measurements
dc.typeJournal article
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage1476
dc.source.endpage1477
dc.source.journalElectronics Letters
dc.source.issue20
dc.source.volume39
imec.availabilityPublished - imec


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