dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Zhang, K.G.Q. | |
dc.contributor.author | Caers, J. | |
dc.contributor.author | Vandepitte, D. | |
dc.contributor.author | Baelmans, M. | |
dc.date.accessioned | 2021-10-15T07:29:52Z | |
dc.date.available | 2021-10-15T07:29:52Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8333 | |
dc.source | IIOimport | |
dc.title | Parameterised modelling of thermo-mechanical reliability for CSP assemblies | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 498 | |
dc.source.endpage | 805 | |
dc.source.journal | ASME Journal of Electronic Packaging | |
dc.source.issue | 4 | |
dc.source.volume | 125 | |
imec.availability | Published - imec | |