Show simple item record

Self-heating induced soft degradation of the early voltage in SiGe: C HBTs

dc.contributor.authorXu, Mingwei
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorSadovnikov, A.
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-15T07:53:02Z
dc.date.available2021-10-15T07:53:02Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8418
dc.sourceIIOimport
dc.titleSelf-heating induced soft degradation of the early voltage in SiGe: C HBTs
dc.typeJournal article
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage646
dc.source.endpage648
dc.source.journalIEEE Electron Device Letters
dc.source.issue10
dc.source.volume24
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
7546.pdf
Size:
281.1Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record