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dc.contributor.authorYakunin, A.M.
dc.contributor.authorSilov, A.Yu.
dc.contributor.authorKoenraad, P.M.
dc.contributor.authorVan Roy, Wim
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorWolter, J.H.
dc.date.accessioned2021-10-15T07:53:55Z
dc.date.available2021-10-15T07:53:55Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8421
dc.sourceIIOimport
dc.titleCharge manipulation and imaging of the Mn acceptor state in GaAs by cross-sectional scanning tunneling microscopy
dc.typeJournal article
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.source.peerreviewno
dc.source.beginpage539
dc.source.endpage545
dc.source.journalSuperlattices and Microstructures
dc.source.issue3_6
dc.source.volume34
imec.availabilityPublished - imec
imec.internalnotesProceedings of the joint 6th International Conference on New Phenomena in Mesoscopic Structures and 4th International Conference on Surfaces and Interfaces of Mesoscopic Devices; Maui, HI, 1-5 December 2003


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