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ESD protection elements during HBM stress tests - further numerical and experimental results

dc.contributor.authorRuss, Christian
dc.contributor.authorGieser, H.
dc.contributor.authorVerhaege, Koen
dc.date.accessioned2021-09-29T13:16:02Z
dc.date.available2021-09-29T13:16:02Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/845
dc.sourceIIOimport
dc.titleESD protection elements during HBM stress tests - further numerical and experimental results
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage285
dc.source.endpage294
dc.source.journalQuality and Reliability Engineering International
dc.source.issue4
dc.source.volume11
imec.availabilityPublished - open access
imec.internalnotesESREF '94. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. 4-7 Oct. 1994; Glasgow, UK


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