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Evidence for source-side injection hot carrier effects on lateral DMOS transistors

dc.contributor.authorAresu, Stefano
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMoens, P.
dc.contributor.authorManca, Jean
dc.contributor.authorWojciechowski, D.
dc.contributor.authorGassot, P.
dc.date.accessioned2021-10-15T12:39:03Z
dc.date.available2021-10-15T12:39:03Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8482
dc.sourceIIOimport
dc.titleEvidence for source-side injection hot carrier effects on lateral DMOS transistors
dc.typeJournal article
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.beginpage1621
dc.source.endpage1624
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume44
imec.availabilityPublished - imec
imec.internalnotesBest paper award


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