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Effect of fixed dielectric charges on tunnelling transparency in MIM and MIS structures

dc.contributor.authorBernardini, S.
dc.contributor.authorMasson, P.
dc.contributor.authorHoussa, Michel
dc.date.accessioned2021-10-15T12:42:41Z
dc.date.available2021-10-15T12:42:41Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8567
dc.sourceIIOimport
dc.titleEffect of fixed dielectric charges on tunnelling transparency in MIM and MIS structures
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.source.peerreviewno
dc.source.beginpage90
dc.source.endpage95
dc.source.journalMicroelectronic Engineering
dc.source.issue1_4
dc.source.volume72
imec.availabilityPublished - imec


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