Show simple item record

A new method for measuring the saturation velocity of submicron CMOS transistors

dc.contributor.authorSchreutelkamp, Rob
dc.contributor.authorDeferm, Ludo
dc.date.accessioned2021-09-29T13:16:17Z
dc.date.available2021-09-29T13:16:17Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/859
dc.sourceIIOimport
dc.titleA new method for measuring the saturation velocity of submicron CMOS transistors
dc.typeJournal article
dc.contributor.imecauthorDeferm, Ludo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage791
dc.source.endpage793
dc.source.journalSolid State Electronics
dc.source.issue4
dc.source.volume38
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
834.pdf
Size:
195.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record