dc.contributor.author | Chamirian, Oxana | |
dc.contributor.author | Lauwers, Anne | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Van Dal, Mark | |
dc.contributor.author | de Potter de ten Broeck, Muriel | |
dc.contributor.author | Lindsay, Richard | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-15T12:50:29Z | |
dc.date.available | 2021-10-15T12:50:29Z | |
dc.date.issued | 2004-11 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8666 | |
dc.source | IIOimport | |
dc.title | Reaction of Ni and Si0.8Ge0.2: phase formation and thermal stability | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lauwers, Anne | |
dc.contributor.imecauthor | Van Dal, Mark | |
dc.contributor.imecauthor | de Potter de ten Broeck, Muriel | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.beginpage | 297 | |
dc.source.endpage | 302 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 1_4 | |
dc.source.volume | 76 | |
imec.availability | Published - imec | |
imec.internalnotes | European Workshop on Materials for Advanced Metallisation; March 2004 | |